Schlieren interferometer
The method thought by Focault and developed by Töpler implies that a single-pass Schilieren system can be converted into a single-beam Schilieren interferometer by replacing a knife-edge blade edge by a combination of Wollaston-prism-analyzer polarizer. In which some of the rays of light are diverted by the test section.[1] In practice, the capacitor forms from an S-source an image S 'which cuts with a knife. A lens is inserted between the screen and S 'gives an image of the test section. A part of the light rays passing through S at one point in the test section is intercepted by the knife while the other part A converges on the test screen [https://www.osapublishing.org/ao/viewmedia.cfm?uri=ao-11-4-858 1]
Description of the system
Relationship of stripe changes in the Interferogram with density changes.
Appropriate location of density difference.
Field of dynamic flow of complex gases, predictions.
Introduction
Schlieren Technique
If the brightness of the source is constant, the irradiation I is proportional to the beam of light that is stopped by the knife. When the beams do not deviate, section A does not change regardless of the point on the screen. The illumination is uniform and I proportional to S 'that emerges from the blade. When the optical thickness of the test section varies, the section A varies as a result of deviations from the light beams. The variation dI depends on θ x, because the illumination I is proportional to the part A. If b is the distance from the knife to the section yh the height of the section A in the absence of variation, it is shown that:
References:
- ↑ J.M., Desse; Deron, R (2009). "Shadow, Schlieren and Color Interferometry" (PDF). Journal AerospaceLab. 1. pp. 1–0.
- ↑ 1