Christoph Gerber
Christoph Gerber is a titular professor at the Department of Physics, University of Basel, Switzerland.
Christoph Gerber is the co-inventor of the atomic force microscope. He was among the 250 most cited living physicists in the world in the year 2000.[1]
Christoph Gerber is a titular professor at the Department of Physics, University of Basel, Switzerland. He was a founding member and Director for Scientific Communication of the NCCR (National Center of Competence in Research Nanoscale Science). He was formerly a Research Staff Member in Nanoscale Science at the IBM Research Laboratory in Rueschlikon, Switzerland, and has served as a project leader in various programs of the Swiss National Science Foundation.
For the past 35 years, his research has been focused on nanoscale science. He is a pioneer in scanning probe microscopy, who made major contributions to the invention of the scanning tunneling microscope, the atomic force microscope (AFM),[2] and AFM techniques in high vacuum and at low temperatures.[3]
He is the author and co-author of more than 165 scientific papers that have appeared in peer-reviewed journals and has been cited approximately 29'000 times in cross-disciplinary fields. He belongs to the one hundred worldwide most cited researchers in Physical Sciences. He has given numerous plenary and invited talks at international conferences.
His work has been recognized with multiple honorary degrees and various awards and appeared in numerous articles in daily press and TV coverage. 2016 he has been awarded the Kavli Prize in Nanoscience together with Gerd Binnig and Calvin Quate for the Scanning Force Microscope. He is a Fellow of the American Physical Society and a Fellow of the Institute of Physics UK. His IP portfolio contains 37 patents and patent publications. His private interest range from literature (scientific and a good novel) to art and sports (he is a passionate skier and plays an acceptable round of golf).
His current interests include
- Biochemical sensors based on AFM Technology
- Chemical surface identification on the nanometer scale with AFM
- Nanomechanics, nanorobotics, molecular devices at the ultimate limits of measurement and fabrication
- Atomic force microscopy research on insulators
- Self-organization and self-assembly at the nanometer scale
References
- ↑ "Physics category list". ISIHighlyCited.com. Retrieved 18 May 2012.
- ↑ Binnig, G.; Quate, C. F.; Gerber, Ch. (1986). "Atomic Force Microscope". Physical Review Letters. 56 (9): 930. doi:10.1103/PhysRevLett.56.930. PMID 10033323.
- ↑ Giessibl, F. J. (1991). "A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9 (2): 984. doi:10.1116/1.585441.
External links
- http://www.cantileversensors.unibas.ch/ChGerber/
- http://hcr3.isiknowledge.com/author.cgi?&link1=Results&id=144